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Measurement technology and intelligent instruments: Intern. symp. (9 ; June 29- July 2, 2009 ; St Petersburg).
Measurement technology and intelligent instruments IX [Text] : selected papers 9th Intern. symp. ... 29- July 2, 2009, St Petersburg / Measurement technology and intelligent instruments: Intern. symp. (9 ; June 29- July 2, 2009 ; St Petersburg) ; eds.: Y. Chugui, Y. Gao, K.-Ch. Fan, R. Taymanov, K. Sapozhnikova. - Zuerich : Trans Tech Publ., 2010. - xx, 656 p. : il. - (Key Engineering Materials ; vol. 437). - Библиогр. в конце ст. - ISBN 978-0-87849-273-2 : б/ц р.ББК Ф I-12.1;063
Рубрики: ФИЗИКА
Кл.слова (ненормированные):
МЕТРОЛОГИЯ -- новые методы измерений -- неразрушаюший контроль и диагностика -- оптическая томография -- рентгеновская томография -- КОНФЕРЕНЦИИ
Аннотация: This special collection focuses on measurement science and metrology: micro- and nano- measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, terahertz technologies for science, industry and biomedicine, intelligent measuring instruments and systems for industry and transport, measurements of geometrical and mechanical quantities, measurements and metrology for humanitarian fields and education in measurement science.????The aim was to present the current state and evolution of measuring technology and intelligent instruments, to highlight novel technologies for science, industry and engineering, and to spot promising ways towards further development, of new technologies for measurement, at the international level.
Доп.точки доступа: Chugui, Y. \ed.\; Gao, Y. \ed.\; Fan, K.-Ch. \ed.\; Taymanov, R. \ed.\; Sapozhnikova, K. \ed.\
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